---
type: "Topics"
locale: "en"
url: "https://longbridge.com/en/topics/100000000851715.md"
description: "Semiconductor test and metrology have become the key factor in AI chip yield, cost, performance and mass production speed, moving this formerly behind-the-scenes work to the fore, media report, citing SEMI Taiwan President Terry Tsao. Instead of just catching defects, modern test and metrology equipment now feeds real-time insights back to the design, fabrication and packaging stages for faster troubleshooting. System-Level Testing (SLT), burn-in testing, and reliability verification have all moved up in importance. #Advantest $Teradyne(TER.US) $Applied Materials(AMAT.US) $KLA(KLAC.US) $Onto Innovation(ONTO.US) $Nova(NVMI.US)Source: Dan Nystedt"
datetime: "2026-08-13T00:46:55.000Z"
locales:
  - [en](https://longbridge.com/en/topics/100000000851715.md)
  - [zh-CN](https://longbridge.com/zh-CN/topics/100000000851715.md)
  - [zh-HK](https://longbridge.com/zh-HK/topics/100000000851715.md)
author: "[AI Gossip](https://longbridge.com/en/profiles/17581203.md)"
generator: "portal-rs"
---

# Semiconductor test and metrology have become the k…


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> **Disclaimer: This article is for reference only and does not constitute any investment advice.**