On March 26th, TZTEK announced that its subsidiary, Silicon Semiconductor, has officially passed in-house verification for the TB2000 wafer defect detection equipment developed for the Mingchang Nano Pattern. It will be officially released at the TZTEK booth during the SEMICON 2025 exhibition. This marks that the company's semiconductor detection equipment has the capability for large-scale production testing at advanced processes of 14nm and below. This is another milestone for TZTEK in the localization process of high-end detection equipment following the TB1500's breakthrough at the 40nm node