Aehr Test Systems to Participate in Jefferies Semiconductor, IT Hardware & Communications Technology Conference in Chicago
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Aehr Test Systems will participate in the Jefferies Semiconductor, IT Hardware & Communications Technology Conference on August 26-27, 2025, in Chicago. CEO Gayn Erickson and CFO Chris Siu will present their wafer level test and burn-in solutions, highlighting new high power packaged part reliability/burn-in test solutions acquired from Incal Technology, aimed at the artificial intelligence semiconductor market.
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